Apparatus and method for hybrid pin control of boundary scan app

Details Apparatus and method for hybrid pin control of boundary scan app Apparatus and method for hybrid pin control of boundary scan app

1997-07-28

2000-08-22

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

G01R 3128

Patent

active

061088072

ABSTRACT:
In accordance with the present invention, an apparatus and method for implementing a new user-defined B-S instruction called PINCONTROL is disclosed. When PINCONTROL is in effect, an output pin can be configured to be either driving a constant 0, driving a 1, in the high-impedance (high-Z) state or in the control of system logic; and different pins of the same chips may assume different configurations depending on the content of the capture and update portion of the B-S register. This instruction provides an improved fault insertion capability. For example, if it is desired to inject a stuck-at-0 fault at pin p, pin p can be configured to drive a constant 0 while allowing other pins to function normally. A stuck-at-1 fault can also be injected by configuring pin p to drive a constant 0 while allowing other pins to function normally. An open fault can also be injected by configuring pin p into a high-impedance state. As will described, multiple faults of the same or different type may be injected, as can transient faults with different durations. This kind of fault insertion capability can be used to verify the fault-tolerant capability of a fault-tolerant system and for the verification of system diagnostics software.

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