4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Richard Joseph Noreika

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Apparatus and method for evaluating printed circuit board...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Apparatus and method for evaluating the surface insulation resis

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Apparatus and method for evaluating the surface insulation...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Method of making electronic package assembly with protective enc

Metal working – Method of mechanical manufacture – Electrical device making
Patent

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Profile ID: LFUS-PAI-P-1159031

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