Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent
1997-12-02
2000-04-18
Breneman, Bruce
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
438691, 438693, 216 89, B24B 100
Patent
active
06051499&
ABSTRACT:
Slurry is provided to the surface of the polishing pad by pumping the slurry up through a central port, or by dripping the slurry down onto the surface of the polishing pad from a slurry feed tube. A slurry wiper, which may have one or more flexible members, sweeps the slurry evenly and thinly across the polishing pad. A control system coordinates the distribution of slurry to the polishing pad with the motion of the carrier head.
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Cheng Tsungnan
Guthrie William L.
Marks Jeffrey
Ocanada Ivan A.
Shendon Norm
Applied Materials Inc.
Breneman Bruce
Zervigon Rudy
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