Apparatus and method for contactless measurement of coating thic

Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01B 1502, G01N 2300

Patent

active

050216554

ABSTRACT:
An apparatus for measuring the thickness of a coating on a work piece includes a table for receiving and positioning the coated work piece and beta-ray backscatter measuring instrument for determining the thickness of the coating on the work piece. An air gauge measures accurately the position of the surface of the work piece and causes the measuring detector instrument to be positioned a predetermined distance above the surface of the work piece. The air gauge includes an orifice having a known positional relationship with respect to the beta-ray measuring instrument. The air gauge positions the orifice a known distance above a particular location on the surface of the work piece. The apparatus then positions the beta-ray measuring instrument over that particular location on the work piece, at the predetermined distance above the surface.

REFERENCES:
patent: 3720833 (1973-03-01), Hay
patent: 4424445 (1984-01-01), Joffe et al.
patent: 4437012 (1984-03-01), Cavy et al.
patent: 4441022 (1984-04-01), Joffe et al.
patent: 4449048 (1984-05-01), Pinches et al.
patent: 4451732 (1984-05-01), Spongr et al.
patent: 4771173 (1988-09-01), Weismuller
SooHoo et al.,-"Transmittance and Reflectance of a Coated Substrate with Application to Index Measurement of Thin Films," 49 J. Appl. Phys. pp. 801-803 (Feb. 1978).
Ingrey-"Analyzing Semiconductors with Auger Spectroscopy," Test and Measurement World, pp. 76-82 (Sep. 1983).
B. C. Ames Co.-Accuflow Air Gaging, Catalog 87AG (1987).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for contactless measurement of coating thic does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for contactless measurement of coating thic, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for contactless measurement of coating thic will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1028350

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.