Amorphous etch stop for the anisotropic etching of substrates

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S300000, C438S524000, C438S705000

Reexamination Certificate

active

07045407

ABSTRACT:
Methods of forming an amorphous etch stop layer by implanting a substrate with an element that is electrically neutral within the substrate are described. The use of elements that are electrically neutral within the substrate prevents electrical interference by the elements if they diffuse to other areas within the substrate. The amorphous etch stop layer may be used as a hard mask in the fabrication of transistors or other devices such as a cantilever.

REFERENCES:
patent: 4857986 (1989-08-01), Kinugawa
patent: 5864161 (1999-01-01), Mitani et al.
patent: 5869359 (1999-02-01), Prabhakar
patent: 6060403 (2000-05-01), Yasuda et al.
patent: 6071783 (2000-06-01), Liang et al.
patent: 6461967 (2002-10-01), Wu et al.
patent: 6774000 (2004-08-01), Natzle et al.
patent: 6784076 (2004-08-01), Gonzalez et al.
Madou, Marc J., Fundamentals of microfabrication, pp. 172-174 and 209, 211 and 212, © 1997 by CRC Press LLC, 2000 Corporate Blvd., N.W., Boca Raton, Florida 33431.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Amorphous etch stop for the anisotropic etching of substrates does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Amorphous etch stop for the anisotropic etching of substrates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Amorphous etch stop for the anisotropic etching of substrates will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3651778

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.