Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-09-30
2009-06-23
Pham, Thanhha (Department: 2894)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S627000, C438S648000, C438S656000, C257SE21168, C427S249170
Reexamination Certificate
active
07550385
ABSTRACT:
A method for forming a metal carbide layer begins with providing a substrate, an organometallic precursor material, at least one doping agent such as nitrogen, and a plasma such as a hydrogen plasma. The substrate is placed within a reaction chamber; and heated. A process cycle is then performed, where the process cycle includes pulsing the organometallic precursor material into the reaction chamber, pulsing the doping agent into the reaction chamber, and pulsing the plasma into the reaction chamber, such that the organometallic precursor material, the doping agent, and the plasma react at the surface of the substrate to form a metal carbide layer. The process cycles can be repeated and varied to form a graded metal carbide layer.
REFERENCES:
patent: 3288829 (1966-11-01), Wilkinson
patent: 6015917 (2000-01-01), Bhandari et al.
patent: 6337151 (2002-01-01), Uzoh et al.
patent: 6428859 (2002-08-01), Chiang et al.
patent: 2004/0009307 (2004-01-01), Koh et al.
patent: 2004/0256351 (2004-12-01), Chung et al.
patent: 2005/0181555 (2005-08-01), Haukka et al.
patent: 2006/0223300 (2006-10-01), Simka et al.
patent: 2007/0054046 (2007-03-01), Ishizaka et al.
patent: WO 01/66832 (2001-09-01), None
patent: WO 01/99166 (2001-12-01), None
Wang S J et al.: “Influence of Nitrogen Doping on the Barrier Prperties of Sputtered Tantalum Carbide Films for Copper Metallization”, Japanese Journal of Applied Physics, Japan Society of Applied Physics, Tokyo, JP, vol. 40, No. 11, Part 1, Nov. 2001, pp. 6212-6220, XP001089366.
PCT International Search Report and Written Opinion of the International Searching Authority, Application No. PCT/US2006/037578, mailed Feb. 1, 2007.
U.S. Appl. No. 11/173,858; Title: Post Polish Anneal of Atomic Layer Deposition Barrier Layers; Inventor: Steven W. Johnston; filed Jun. 30, 2005.
U.S. Appl. No. 11/096,860; Title: Organometallic Precursors for the Chemical Phase Deposition of Metal Films in Interconnect Applications; Inventor: Harsono Simka; filed Mar. 31, 2005.
Dominguez Juan E.
Dubin Valery M.
Johnston Steven W.
Lavoie Adrien R.
O'Brien Kevin P.
Engineer Rahul D.
Intel Corporation
Pham Thanhha
LandOfFree
Amine-free deposition of metal-nitride films does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Amine-free deposition of metal-nitride films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Amine-free deposition of metal-nitride films will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4087199