Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-06-13
2006-06-13
Torres, Joseph D. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S733000
Reexamination Certificate
active
07062696
ABSTRACT:
A test system includes a test data generator to provide test data (e.g., a test pattern) to a subject circuit (e.g., a digital television video circuit). The test data is functionally to verify the subject circuit. The functional verification of the subject circuit is performed utilizing an output of the subject circuit generated responsive to the test data in accordance with an operational functionality of the subject circuit. The test data generator is also coupled to provide the test data to a built-in self-test (BIST) circuit so as to enable the built-in self-test circuit to receive the test data.
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Barry John Lee
Erett Marc Harold
Farhat Afif
Mears James
Sauerwald Mark
Darby & Darby PC
Gaffney Matthew M.
National Semiconductor
Torres Joseph D.
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