Algorithmic reactive testbench for analog designs

Details Algorithmic reactive testbench for analog designs Algorithmic reactive testbench for analog designs

2007-09-05

2010-12-14

Doan, Nghia M (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C703S003000, C703S013000, C703S014000, C714S740000, C714S741000

Reexamination Certificate

active

07853908

ABSTRACT:
An Algorithmic Reactive Testbench (ART) system is provided for the simulation/verification of an analog integrated circuit design. The ART system is a high level simulation/verification environment with a user program in which one or more analog testbenches are instantiated and operated as prescribed in an algorithmic reactive testbench program, and the properties of the unit testbenches (test objects) can be influenced by prior analysis of themselves or other tests. The test object may also contain various properties including information reflecting the status of the test object. The modification of a property of a test object is an act of communication in the ART system from the algorithmic reactive testbench program to the test object.

REFERENCES:
patent: 7191112 (2007-03-01), Demler et al.
patent: 2003/0103137 (2003-06-01), Espertshuber et al.
patent: 2004/0044509 (2004-03-01), Demler et al.
patent: 2007/0214438 (2007-09-01), Chen et al.

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