4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Takeshi Umemoto

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AFM tweezers, method for producing AFM tweezers, and...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Horizontal packed column consisting of multiple chambers with fl

Liquid purification or separation – Particulate material type separator – e.g. – ion exchange or... – Selective units or compartments
Patent

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Manufacturing inspection/analysis system analyzing device,...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Method of manufacturing a semiconductor device with a pair of ra

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support
Patent

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Method of manufacturing a semiconductor device with a pair...

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame – With separate tie bar element or plural tie bars
Reexamination Certificate

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Profile ID: LFUS-PAI-P-525210

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