Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1999-02-08
2000-07-04
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
Of surface reflection
359496, G01J 400
Patent
active
060846755
ABSTRACT:
Disclosed is a compensator/retarder system which allows adjustment to eliminate introduction of significant deviation and/or displacement into the propagation direction of a beam of electromagnetic radiation caused to interact therewith, even when the present invention retarder system is caused to continuously rotate in a rotating compensator ellipsometer system. Also disclosed is a method of calibration of an ellipsometer/polarimeter system which includes a present invention compensator/retarder system.
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Herzinger Craig M.
Johs Blaine D.
J. A. Woollam Co. Inc.
Pham Hoa Q.
Welch James D.
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