Additional post-glass-removal processes for enhanced cell...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Statutory Invention Registration

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Statutory Invention Registration

active

11650595

ABSTRACT:
A method is provided for the production of solar cells from raw crystalline p-type silicon wafer material. The surface condition prior to SiNx deposition is improved by providing additional process steps following the phosphorous glass removal and prior to the SiNx anti-reflection coating deposition. In one embodiment, the wafer is submitted to a thermal anneal under oxygen atmosphere followed by a wet-chemical oxide removal. The anneal reduces the surface phosphorous concentration by diffusion, reduces lattice defects in the emitter and oxidizes the silicon surface. In another embodiment, both a surface oxide is obtained and subsequently removed with wet chemistry. This sequence allows for an integration of the phosphorous glass removal, the wet-chemical oxidation, and the SiOx removal into a single machine.

REFERENCES:
patent: 6946404 (2005-09-01), Bijker et al.
patent: 2004/0029334 (2004-02-01), Bijker et al.
patent: 2006/0231031 (2006-10-01), Dings et al.
patent: 2006/0292891 (2006-12-01), Bijker et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Additional post-glass-removal processes for enhanced cell... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Additional post-glass-removal processes for enhanced cell..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Additional post-glass-removal processes for enhanced cell... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3896415

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.