Adaptor With Clocks For Like Parts of Different Scan Paths

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S731000

Reexamination Certificate

active

07996740

ABSTRACT:
Scan architectures are commonly used to test digital circuitry in integrated circuits. The present disclosure describes a method of adapting conventional scan architectures into a low power scan architecture. The low power scan architecture maintains the test time of conventional scan architectures, while requiring significantly less operational power than conventional scan architectures. The low power scan architecture is advantageous to IC/die manufacturers since it allows a larger number of circuits (such as DSP or CPU core circuits) embedded in an IC/die to be tested in parallel without consuming too much power within the IC/die. Since the low power scan architecture reduces test power consumption, it is possible to simultaneously test more die on a wafer than previously possible using conventional scan architectures. This allows wafer test times to be reduced which reduces the manufacturing cost of each die on the wafer.

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“Minimized power consumption for scan-based BIST” by Gerstendorfer et al. This paper appears in: Test Conference, 1999. Proceedings. International Publication Date: 1999 on pp. 77-84 ISBN: 0-7803-5753-1 INSPEC Accession No. 6536352.
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“Core test connectivity, communication, and control” by Whetsel This paper appears in: Test Conference, 1998. Proceedings., International Publication Date: Oct. 18-23, 1998 on pp. 303-312 ISSN: 1089-3539 ISBN: 0-7803-5093-6 I NSPEC Accession No. 6251460.
Girard, P.; Guiller, L.; Landrault, C.; Pravossoudovitch, S.;, “Low power BIST design by hypergraph partitioning: methodology and architectures,” Test Conference, 2000. Proceedings. International, vol., no., pp. 652-661, 2000 doi: 10.1109/TEST.2000.894260.

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