Adaptive test program generation

Details Adaptive test program generation Adaptive test program generation

2005-08-02

2005-08-02

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C700S086000

Reexamination Certificate

active

06925405

ABSTRACT:
A test program generator that produces test instructions according to a specification of a system being verified. The instructions are typically generated randomly, at least in part, and are then. The system is capable of interpreting events, detecting an impending occurrence of an event, and responding to the event by switching to an alternate input stream.

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A. Chandra, et al “AVGEN—A Test Generator for Architecture Verification” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 3, No. 2, pp. 188-200, Jun. 1995.
Yossi Lichtenstein et al, “Model Based Test Generation for Processor Verification” IBM Israel Science and Technology, Sixth Innovative Applications of Artificail Intelligence Conference, Aug. 1994, pp. 83-94.

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