4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Testing or evaluating

Allon Adir

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Adaptive test program generation

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Converting a mask constraint into a bitset constraint

Coded data generation or conversion – Digital code to digital code converters – To or from variable length codes
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Highly specialized scenarios in random test generation

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method for distributed joint pseudo random decision making

Electrical computers: arithmetic processing and calculating – Electrical digital calculating computer – Particular function performed
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Model-based hardware exerciser, device, system and method...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Profile ID: LFUS-PAI-P-2173798

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