4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Eitan Marcus

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Adaptive test program generation

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Highly specialized scenarios in random test generation

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Test quality through resource reallocation

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
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Profile ID: LFUS-PAI-P-2888758

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