Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-02-06
2007-02-06
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10903836
ABSTRACT:
Generating a density abstraction view for an integrated circuit design by dividing each block in the design that is larger than a predetermined size into a grid of rectangles; calculating a sum of metal area in each rectangle in the grid; creating an object in each rectangle having an area equal to the metal area sum of the rectangle; and storing all the created objects for the block as a view. The view may be stored in a layout database along with any other views for the integrated circuit design, and then used to determine density of a tile overlapping with the block by adding the area of the square objects in the density view that overlap with the tile to the tile.
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Raman Santhanakrishnan
Shrowty Vikram
Garbowski Leigh M.
LSI Logic Corporation
Strategic Patent Group P.C.
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