Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-11-29
2005-11-29
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06971079
ABSTRACT:
A method and apparatus for improving the timing accuracy of an integrated circuit through region-based voltage drop budgets is provided. Further, a method for performing timing analysis on an integrated circuit partitioned into voltage drop regions is provided. During the timing analysis, a set of logic paths segments in each voltage drop region is tested to ensure that the integrated circuit meets a set of predefined timing requirements. Logic path segments that reside in different voltage drop regions are tested using a supply voltage inputted by the respective voltage drop region.
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Bobba Sudhakar
Trivedi Pradeep
Yee Gin
Garbowski Leigh M.
Osha & Liang LLP
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