Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2007-07-06
2009-11-17
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S154000, C365S063000, C365S072000, C365S188000
Reexamination Certificate
active
07619916
ABSTRACT:
An SRAM cell has reduced gate and sub-threshold leakage currents. The SRAM cell is designed to include eight operatively coupled transistors to reduce leakage currents irrespective of data stored in the SRAM cell. The transistors lower the effective supply voltage at different nodes, when either bit ‘0’ or ‘1’ is stored in the SRAM cell. The reduced effective supply voltage is passed to other coupled transistors for minimizing leakages. The SRAM cell operates in an active mode and dissipates no dynamic power during active mode to inactive mode transition and vice-versa operations. The SRAM cell is also capable of reducing bit line leakage currents under suitable conditions.
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Graybeal Jackson LLP
Jorgenson Lisa K.
Nguyen Viet Q
Rusyn Paul F.
STMicroelectronics Pvt. Ltd.
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