4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Temperature measuring system

Paul F. Rusyn

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8-T SRAM cell circuit, system and method for low leakage...

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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Adhesive laminate label for a communication connector jack...

Electrical connectors – With indicating or identifying provision – Distinct indicia bearing member
Reexamination Certificate

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Adhesive laminate label for a communication connector jack...

Electrical connectors – With indicating or identifying provision – Distinct indicia bearing member
Reexamination Certificate

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Biasing structure for accessing semiconductor memory cell...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Biasing structure for accessing semiconductor memory cell...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2162155

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