Touryanski Alexander G.
Trapp David R.
Triftshauser Werner
Troxler, Sr. William F.
Turcu I. C. Edmond
Tye Gareth A.
U.S. Government as represented by the Director, National Securit
UCL Business PLC
Ueda Tomoyasu
Uematsu Toshio
Uhrich Craig E.
Ullman Bo
Ulyanenkov Alex
USC--Dept. of Materials Science
Ushio Satoshi
Utaka Tadashi
V-Ray Imaging Corporation
Van Alen Johannes P. M.
van den Hoogenhof Walter
Van Der Sluis Paul