4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis
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D E F G H I J K L M N O P Q R S T U V W X Y Z 0 1 2 3 4 5 6 7 8 9 ! " $ ' ( ) * , - / : < = > ? @ [ \ ] ^ ` { | } ~ €

Cahn Robert

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Calandra Peter M.

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Cambridge Surface Analytics Ltd.

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Caress Virginia B.

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Carl-Zeïss-Stiftung

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Carpenter Donald A.

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Carr Martin J.

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Carroll Frank

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Carter Tony

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Carver Gary P.

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Cederström Björn

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Cederstrom Bjorn

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Centre National de la Recherche Scientifique (CNRS).

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Chalmers Alex

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Chalmers Alexander

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Chambers John L.

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Chapman Leroy D.

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Chapman Leroy Dean

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Chen Baozhen

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China Aerospace Corporation and Beijing Normal University

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