4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

David R. Trapp

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High resolution direct-projection type x-ray microtomography...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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High resolution direct-projection type x-ray microtomography...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High resolution direct-projection type x-ray microtomography...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Lens bonded X-ray scintillator system and manufacturing...

Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Reexamination Certificate

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Scintillator optical system and method of manufacture

Radiant energy – Invisible radiation responsive nonelectric signalling – Luminescent device
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2371655

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