4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis
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Shepherd William B.

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Shinada Kuninori

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Siemens Industrial Automation, Inc.

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Smith Kingsley

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Smith Kingsley L.

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Smith Mark F.

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Smithsonian Astrophysical Observatory

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Snell Edward H.

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Snell Edward Holmes

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Sobolewski Stanislaw

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Societe Nationale Industrielle et

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Soga Takashi

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SPAD Technologies, Inc.

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Sparks, Jr. Cullie J.

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Speller Robert D.

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Sperr Peter

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Srajer George

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SSCI, Inc.

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Stahl Johannes

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Stanford Joel R.

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