4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

William B. Shepherd

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Backscatter imaging using Hadamard transform masking

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Bond strength measurement system using shock loads

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
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Profile ID: LFUS-PAI-P-2848903

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