4. Optics: measuring and testing
  5. Document pattern analysis or verification
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Maase Daniel F.

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Macnab Neil Aitchison

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Magna Chip Semiconductor Ltd.

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Magyar Tudomanyos Akademia Kozponti Fizikai Kutato Intezete

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Mars Engineering Corporation

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Martinuzzo Steven

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Masten Opto-Diagnostics Company

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Matson Bruce

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McCaffery Shaun

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McInerney Henry F.

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Melville Ross D.

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MGC Manfred Gaus Creative Medien Marketing GmbH

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Microtrace, LLC

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Mikoh Technology Limited

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Mishima Yasuo

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Mockel Karl-Heinz

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