LandOfFree - US Patents - Listing for Optics: measuring and testing,Document pattern analysis or verification

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Haga Hidemi

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Halter Peter

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Hamori Andras

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Heidelberger James E.

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Heimann Biometric Systems GmbH

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Hillmann Juergen

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Hiltner James

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Hino Toshihiko

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Holl Norbert

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Holzner Florian

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Hong Sa Hyang

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Hood Barry Alan

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Hornung Heinz-P.

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Hosino Hidekazu

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Hossfeld Michael

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