4. Optics: measuring and testing
  5. Document pattern analysis or verification
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Lambert Laurent

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Landis & Gyr

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Laser Lock Technologies, Inc.

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Lawandy Nabil M

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Lawrence Christopher R

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Lee Ho-Gyu

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Lee Tae Hun

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Leventhal Stephen Richard

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Lin Shih-Schon

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Lindstrand Mikael

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Lisei Renzo

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Louis Pina Insausti Jose

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Lucke Jonathan N.

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