4. Optics: measuring and testing
  5. By configuration comparison
  6. With comparison to master, desired shape, or reference voltage
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Modular Vision Systems Inc.

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Moore Adam Q.

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Nadivi Jacob

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Nakashima Katsuyoshi

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Nakata Toshihilo

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Narduzzo Gabriel

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Nippon Jidoseigyo Ltd.

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Nishii Satoshi

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Novak Walter I.

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Nozaki Takeo

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Ohsaki Morihide

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Okamura Masaru

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Orgad Dror

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Osaka Seimitsu Kikai Kabushiki Kaisha

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Parat Guy

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Passoni Gianfranco

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Pawa Kharati

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Pham Hoa O.

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Robertson Gordon I.

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Rosen Dennis

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