LandOfFree - US Patents - Listing for Optics: measuring and testing,By configuration comparison,With comparison to master, desired shape, or reference voltage

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Bando Eiji

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Bartlett Robert J.

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Bell William

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Ben El Mekki Manfred

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Bertrand Gerard

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Birkbeck College

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Blumcke Thomas

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Bolza-Schunemann Ing H.-B.

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Borgert Gerald D.

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Broadbent William H.

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Brown Derek A.

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Brown Mark D.

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Burke Robert James

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Busch Garland E.

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Busch Garland F.

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