LandOfFree - US Patents - Listing for Coating processes,Measuring, testing, or indicating,Thickness or uniformity of thickness determined

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Weiner Steve A.

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Westdale Virgil William

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Weston Charles H.

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Wilder Alvin D.

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Willemsens Karel S.

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Wilmanns Ingo

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Wittkopf Eugene R.

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Wittmann Manfred

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Wolf Alfred A.

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Wu I-Fan

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Yamamuka Mikio

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Yamano Akira

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Yamazaki Noriaki

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Yang Nelson

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Yang Yi-Mei

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Yatsushiro Tsugio

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Zimmermann Konrad

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