LandOfFree - US Patents - Listing for Coating processes,Measuring, testing, or indicating,Thickness or uniformity of thickness determined

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Lair James H.

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Landreau Jean

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Lange Ulrich

Inventor

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Langfeld Roland

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Larsson P. Tomas

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Lee Byung-Yang

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Lee Dong-Joon

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Letellier Michel

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Levy Yuval

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Lin Chaung

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Lind Theodore E.

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Lockyer Keith E.

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Lomasney Henry

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Lorenz Max R.

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Luhr Gerhard

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Lummel Dieter

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Lund James L.

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