4. Coating processes
  5. Measuring, testing, or indicating
  6. Thickness or uniformity of thickness determined

Alvin D. Wilder

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Method of making silicon device with uniformly thick polysilicon

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent

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Silicon device with uniformly thick polysilicon

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board
Patent

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Profile ID: LFUS-PAI-P-681184

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