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Access circuit and method for allowing external test voltage...

Static information storage and retrieval – Interconnection arrangements – Transistors or diodes
Reexamination Certificate

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Access circuit and method for allowing external test voltage...

Static information storage and retrieval – Interconnection arrangements – Transistors or diodes
Reexamination Certificate

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Access circuit and method for allowing external test voltage...

Static information storage and retrieval – Interconnection arrangements – Transistors or diodes
Reexamination Certificate

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Area efficient stacked TCAM cell for fully parallel search

Static information storage and retrieval – Interconnection arrangements – Transistors or diodes
Reexamination Certificate

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