Static information storage and retrieval – Interconnection arrangements – Transistors or diodes
Reexamination Certificate
2006-10-03
2006-10-03
Zarabian, Amir (Department: 2827)
Static information storage and retrieval
Interconnection arrangements
Transistors or diodes
C365S175000, C365S177000, C365S201000, C257S499000, C257S544000, C257SE29261
Reexamination Certificate
active
07116570
ABSTRACT:
An access circuit selectively couples an externally accessible terminal to each of a plurality of isolated DRAM wells in which respective DRAM arrays are fabricated. The access circuit for each well includes first and second transistors fabricated in respective wells coupled between the externally accessible terminal and a respective one of the DRAM wells. The well of the first transistor is coupled to the externally accessible terminal, and the well of the other transistor is coupled to a respective DRAM well. A control circuit applies select signals to gate electrodes of the first and second transistors. The control circuit includes respective shunt transistors that shunt the gate electrodes to the source regions of the first and second transistors when the transistors are turned off to isolate the respective DRAM wells from the external terminal regardless of the magnitude and polarity of a test voltage applied to the externally accessible terminal.
REFERENCES:
patent: 4395723 (1983-07-01), Harari
patent: 5933378 (1999-08-01), Gans et al.
patent: 6262625 (2001-07-01), Perner et al.
patent: 6278287 (2001-08-01), Baze
patent: 6888769 (2005-05-01), Kirsch
patent: 2003/0112659 (2003-06-01), Ohsawa
Favrat, Pierre et al., “A High-Efficiency CMOS Voltage Doubler”, IEEE Journal of Solid-State Circuits, vol. 33, No. 3, Mar. 1998, pp. 410-416.
Dorsey & Whitney LLP
Micro)n Technology, Inc.
Pham Ly Duy
Zarabian Amir
LandOfFree
Access circuit and method for allowing external test voltage... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Access circuit and method for allowing external test voltage..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Access circuit and method for allowing external test voltage... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3712778