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Selected: C

Chemical analyzer for industrial process control

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate

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Chemical detection using calorimetric spectroscopy

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Chemical enhancement in surface enhanced raman scattering...

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate

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Chemical identification by flash spectroscopy

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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Chemical imaging system

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Patent

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Chemical mechanical planarization (CMP) slurry quality...

Optics: measuring and testing – For size of particles
Reissue Patent

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Chemical mechanical planarization (CMP) slurry quality...

Optics: measuring and testing – For size of particles
Reexamination Certificate

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Chemical reaction velocity measuring apparatus

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Chemical reaction velocity measuring apparatus

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Chemical reaction velocity measuring apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Chemical sensing system and method

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

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Chemical sensing with noise pre-compensation

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

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Chemical sensor based on porous silicon

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Chemical species optical analyzer with multiple fiber channels

Optics: measuring and testing – By dispersed light spectroscopy – With synchronized spectrum repetitive scanning
Patent

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Chemical substance measuring apparatus using optical waveguides

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

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Chip scale atomic gyroscope

Optics: measuring and testing – By light interference – Rotation rate
Reexamination Certificate

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Chip scale atomic gyroscope

Optics: measuring and testing – By light interference – Rotation rate
Reexamination Certificate

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Chip-scale optical spectrum analyzers with enhanced resolution

Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate

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Chirp and Doppler optical gauge

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Chirp indicator of ultrashort optical pulse

Optics: measuring and testing – By light interference – Holography
Reexamination Certificate

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