4. Optics: measuring and testing
  5. By configuration comparison
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Pattern inspection method and system

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Process and device for high resolution optical testing of surfac

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Process and device for the optical testing of a surface

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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