LandOfFree - US Patents - Listing for Image analysis,Histogram processing,For setting a threshold

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Method of and apparatus for detecting heights of points on surfa

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for detecting objects in an assembly lin

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for detecting pattern defects

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for detecting pattern defects by means o

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for enlarging/reducing two-dimensional i

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for enlarging/reducing two-dimensional i

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for extracting image contour data

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for forming a one-page-image

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for generating image data representing i

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for geometric pattern inspection employi

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for high-speed editing of progressively-

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for image smoothing along a tangential d

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for increasing the processing speed in t

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for inspecting bottle or the like

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for inspecting conductive pattern on pri

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for inspecting the minimum annular width

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for inspecting wiring pattern on printed

Image analysis – Histogram processing – For setting a threshold

Patent

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Method of and apparatus for measuring pattern profile

Image analysis – Histogram processing – For setting a threshold

Patent

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