Image analysis – Histogram processing – For setting a threshold
Patent
1994-08-01
1995-04-18
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 25, 348 87, 348126, 356237, G01G 1102, G06K 936
Patent
active
054085381
ABSTRACT:
A printed pattern is provided with a wiring pattern having a land and a through hole surrounded by the land. The wiring pattern and the through hole are read by a photoelectric image sensor to obtain a pattern image and a hole image, respectively. A pattern gauge image is defined by the pattern image, and a hole gauge image having a ring-like shape is obtained from the hole image. A logical product between the inversion image of the pattern gauge image and the hole gauge signal provides a protrusion region image. Since the hole gauge image has an isotropic contour, the minimum annular width of the land is detected, independent of the direction in which the through hole is deviated from the land.
REFERENCES:
patent: 4040748 (1977-08-01), Belleson et al.
patent: 4223387 (1980-09-01), Danielsson et al.
patent: 4481664 (1984-11-01), Linger et al.
patent: 4555798 (1985-11-01), Broadbent, Jr. et al.
patent: 4980570 (1990-12-01), Yasunaga et al.
patent: 5027417 (1991-06-01), Kitakado et al.
patent: 5119434 (1992-06-01), Bishop et al.
Hoki Tetsuo
Kitakado Ryuji
Omae Takao
Tsujinaka Hisayuki
Boudreau Leo H.
Dainippon Screen Mfg. Co,. Ltd.
Prikockis Larry J.
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