Apparatus and method for intra process on wafer monitoring of de

Apparatus and method for low power position sensing systems

Apparatus and method for mapping inhomogeneities on the surface

Apparatus and method for measurement of magnetic remanence-thick

Apparatus and method for measuring conductance including a tempe

Apparatus and method for measuring hysteresis characteristics in

Apparatus and method for measuring instantaneous power using a m

Apparatus and method for measuring insulated track joint resista

Apparatus and method for measuring magnetic properties of...

Apparatus and method for measuring magnetization of surfaces

Apparatus and method for measuring molecular electromagnetic...

Apparatus and method for measuring remanence curve of a...

Apparatus and method for measuring repulsive displacement and re

Apparatus and method for measuring second-order gradient of...

Apparatus and method for monitoring steam turbine shroud clearan

Apparatus and method for non-destructive testing using multi-fre

Apparatus and method for nondestructive evaluation of surface fl

Apparatus and method for obtaining increased sensitivity,...

Apparatus and method for on-line barkhausen measurement

Apparatus and method for on-line inspection of electrically cond