Apparatus and method for mapping inhomogeneities on the surface

Details Apparatus and method for mapping inhomogeneities on the surface Apparatus and method for mapping inhomogeneities on the surface

1989-12-21

1991-07-09

Wieder, Kenneth

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

505726, 505843, 324 715, G01R 3314, G01N 2780

Patent

active

050309129

ABSTRACT:
Apparatus and methodology for mapping the superconductive properties of a sample of superconducting material. The material is cooled so that it is a mixed state and an alternating magnetic field is induced in a portion of the sample to be tested. The harmonic component of the induced alternating magnetic response is measured at a location proximate to the point of induction. As the inducing and measuring devices are displaced relative to the sample the measured amplitude of the harmonic component is stored in suitable storage means as a function of location in the sample. Thus, a map of the superconducting properties of the sample may be generated.

REFERENCES:
patent: 3636437 (1972-01-01), Soulant, Jr. et al.
patent: 4190799 (1980-02-01), Miller et al.
patent: 4589290 (1986-05-01), Sugiyama et al.
patent: 4755753 (1988-07-01), Chern
patent: 4864236 (1989-09-01), Gibson et al.
"Magnetization of High Field Superconductors", C. P. Bean; Review of Modern Physics, 36, pp. 31--39, Jan. 1964.

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