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Tapered hole capacitive probe

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Test fixture for miniature capacitors

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Test methods and structures for semiconductor integrated circuit

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Test strip identification and instrument calibration

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Tester for terminal post resistance for an energy storage elemen

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Thermal conductivity detector circuit

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Three electrode AC detection

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Three-electrode sensor for phase comparison and pulse phase adju

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Tracing electrical conductors by high-frequency constant-energy-

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Tracing electrical conductors by high-frequency loading and impr

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Transducer for converting a varying analog current signal to a b

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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Transmitter of a system for detecting a buried conductor

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Reexamination Certificate

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Transmitter with vernier measurement

Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent

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