Test strip identification and instrument calibration

Details Test strip identification and instrument calibration Test strip identification and instrument calibration

1985-11-12

1987-12-22

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

422 58, 324444, G01R 2702, G01N 2178

Patent

active

047148748

ABSTRACT:
Test device apparatus is disclosed containing a electrically conductive region which provides information concerning the nature of the test device and/or its position. In a preferred embodiment a conductive strip is applied to a test device and used to determine the identification of the test device, the position of the test device and/or calibrate an instrument which is used to read the test device. The conductive strip generates a signal by measuring the resistance ratio of the electrical path through its conductive region using three or more electrodes or probes. The signal obtained by the electrodes is used to determine the characteristics indicated above or to program operational parameters within an instrument used to analyze the test device.

REFERENCES:
patent: 2785057 (1957-03-01), Schwab et al.
patent: 3808527 (1974-04-01), Thomas
patent: 4344064 (1982-08-01), Bitler et al.
patent: 4382063 (1983-05-01), Romito et al.
patent: 4538105 (1985-08-01), Ausschnitt
patent: 4618475 (1986-10-01), Wang

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