4. Electrical connectors
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Probe card for testing semiconductor device

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement
Reexamination Certificate

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Probe connector

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement
Reexamination Certificate

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Probe pins for inspection and slip-on sockets thereof

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement
Patent

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Probe structure

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement
Reexamination Certificate

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Probeless fixture for adapter card testing

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement
Patent

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Probes and methods for testing electrical circuits

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement
Reexamination Certificate

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