Probe pins for inspection and slip-on sockets thereof

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement

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Details

439 82, H01R 1118

Patent

active

054999332

ABSTRACT:
A probe pin for inspection composing a unit to inspect a printed circuit is formed with a conductive metallic tube into which a plunger is inserted with a spring. The plunger is slidably projected from the top end of the conductive metallic tube and a plurality of hollow salients are formed symmetrically on outer surface of the conductive metallic tube to extend in the axial direction so that the conductive metallic tube is easily pushed into a plurality of holding openings formed on an insulated holding plate. Thus, the probe pins come in contact with each contact on the printed circuit without coming off, slanting or bending of the conductive metallic tube or further without breaking the salients or without deviating the installation of the conductive metallic tube from the holding openings on the holding plate, and a slip-on socket is provided to mate with the probe pin for inspection.

REFERENCES:
patent: 4257667 (1981-03-01), Iantorno
patent: 4709973 (1987-12-01), Waters et al.
patent: 4894031 (1990-01-01), Damon et al.
patent: 5135403 (1992-08-01), Rinaldi
patent: 5159265 (1992-10-01), Alfonso et al.
patent: 5225773 (1993-07-01), Richards

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