LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

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Method and apparatus for improving wireline depth measurements

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

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Method and apparatus for impurity detection

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

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Method and apparatus for impurity detection

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

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Method and apparatus for in-situ calibration of quantity...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Fluid or fluid flow measurement

Reexamination Certificate

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Method and apparatus for in-situ detection and isolation of...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Method and apparatus for independent output driver calibration

Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning

Reexamination Certificate

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Method and apparatus for independent output driver calibration

Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Method and apparatus for independently calibrating event...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing

Reexamination Certificate

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Method and apparatus for indicating proximity of film...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method and apparatus for inputting three-dimensional data

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Reexamination Certificate

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Method and apparatus for inspecting a solder joint using a corre

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Patent

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Method and apparatus for inspecting defects in a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Method and apparatus for inspecting defects in a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Method and apparatus for inspecting dovetail edgebreak contour

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Method and apparatus for inspecting dovetail edgebreak contour

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Method and apparatus for inspecting leakage of container

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Method and apparatus for inspecting steam traps, and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Method and apparatus for instrument calibration control

Data processing: measuring – calibrating – or testing – Calibration or correction system

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Method and apparatus for integrated distribution function...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Method and apparatus for integrated distribution function...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

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