Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Patent
1997-04-07
2000-02-08
Wachsman, Hal
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
702 40, 706 20, 706 25, 706 40, 382150, G06F 1700
Patent
active
060236639
ABSTRACT:
A solder joint inspection process and system includes using a correlation values to classify the shape of the solder joint. The solder joint is illuminated by a multiple colors, and the image of the solder joint is captured. This multiple color image is then converted into a plurality of one-dimensional vectors. Each one-dimensional vectors sequence is for one color of the multi-color illumination and for a one-dimensional spatial extent. Correlation values among all combinations of the one-dimensional vector sequences are computed and used for training an automatic solder joint shape classifier.
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patent: 5598345 (1997-01-01), Tokura
patent: 5751910 (1998-05-01), Bryant et al.
patent: 5787408 (1998-07-01), Deangelis
Samsung Electronics Co,. Ltd.
Wachsman Hal
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