Scanning device and method for hierarchically forming a scan pat

Details Scanning device and method for hierarchically forming a scan pat Scanning device and method for hierarchically forming a scan pat

1997-04-11

1999-07-27

Canney, Vincent P.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

G06F 1100

Patent

active

059283742

ABSTRACT:
In a large system such as a parallel computer system, a scan device forms a scan path by hierarchically connecting input and output signal lines of integrated circuits, thereby enabling creating of a short scan path which contain only the necessary integrated circuits. This allows a scan test such as JTAG-SCAN to be effectively made.

REFERENCES:
patent: 5581541 (1996-12-01), Whetsel
patent: 5751736 (1998-05-01), Deroux-Dauphin et al.

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