Method for controlling a test mode of an electric device

Details Method for controlling a test mode of an electric device Method for controlling a test mode of an electric device

1998-01-27

1999-10-26

Barlow, John

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

702 79, 702 89, 702176, 36452841, G06F 1100

Patent

active

059743646

ABSTRACT:
A method for performing a test and controlling the test mode of an electric device. The method reduces the amount of time and labor expended during fabrication, and accordingly enhances productivity by detecting time information from a timer (a clock generator, or a variable clock generator) and multiplying the detected time information by a predetermined value, and controlling the driving time of the device during a test operation in response to the multiplied time value.

REFERENCES:
patent: 4471452 (1984-09-01), Borchert
patent: 5341288 (1994-08-01), Shinskey
patent: 5361230 (1994-11-01), Ikeda et al.
patent: 5453993 (1995-09-01), Kitaguchi et al.
patent: 5490059 (1996-02-01), Mahalingaiah et al.
patent: 5629684 (1997-05-01), Isshiki et al.
patent: 5717652 (1998-02-01), Ooishi

Affiliated with

Also associated with

Rating

Method for controlling a test mode of an electric device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for controlling a test mode of an electric device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for controlling a test mode of an electric device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-774993