Static information storage and retrieval – Read/write circuit – Bad bit
Patent
1997-11-25
1999-09-28
Dinh, Son T.
Static information storage and retrieval
Read/write circuit
Bad bit
3652257, G11C 700
Patent
active
059599065
ABSTRACT:
A semiconductor memory device is shown that includes a normal memory cell array including a plurality of memory cells specified by 2.sup.n word lines and a plurality of column bit lines where an externally input n-bit row address is decoded to activate one of the 2.sup.n word lines. The semiconductor memory device further includes a redundant row fuse decoder that includes a plurality of n-bit address fuse portions each of which can be selectively coded to respond to an n-bit defective row address value in the externally input n-bit row address which corresponds to a word line in the normal memory cell array that includes a defective memory cell. The semiconductor memory device further includes a redundant memory cell array including a plurality of rows of memory cells which can be activated by one of the n-bit address fuse portions in response to the defective row address coded into the n-bit address fuse portion.
REFERENCES:
patent: 5386386 (1995-01-01), Ogihara
patent: 5708619 (1998-01-01), Gillingham
patent: 5768198 (1998-06-01), Moroo
Choi Jong-Hyun
Song Ho-sung
Dinh Son T.
Samsung Electronics Co,. Ltd
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