Selective etch process

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

1566511, 1566571, 15665911, 216 67, 252 791, H01L 2100

Patent

active

056518560

ABSTRACT:
Disclosed is an etch process wherein hydrogen monoiodide (HI) ions are employed to bombard a patterned film, thereby creating geometric features in the patterned film with substantially anisotropic sidewalls. The etch process has a high selectivity to oxide, allowing the etch process to terminate on a thin pad oxide, especially when using a two step etch process. The etch process is also highly selective to photoresist, further enhancing the resulting anisotropic nature of the geometrical feature sidewalls.

REFERENCES:
patent: 4040892 (1977-08-01), Sargent et al.
patent: 4708766 (1987-11-01), Hynecek
patent: 5277750 (1994-01-01), Frank
patent: 5338395 (1994-08-01), Keller et al.

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